|Wafer thickness measurement|
|Trench depth measurement|
|Membrane thickness measurement|
|Laser and LED application|
|MEMs tomography applications|
|New metrology for X-ray mirrors (Video demo).
We have developed a range from focus tool for
roughness measurement. Click here for details.
Quantum Efficiency (QE) Uniformity measurements,
using white light and color scanner technology.
Glass Bow, Roller Wave, full Glass substrate scalable
metrology (0.5 m x 1 m, 2 m x 2 m), and larger glass.