For measurement videos on selected models please click here.

Please contact us for application notes at
New product: End Point Detection

Projection Tool for Topography and QE Uniformity Spectral Mapping Characterisation

Dimensional and Stress Metrology for Bow and Warp measurements on crystalline, thin
film materials, and minipanels.
Wafer thickness measurement
Trench depth measurement
Membrane thickness measurement
Laser and LED application
MEMs tomography applications
New metrology for X-ray mirrors (Video demo).

We have developed a range from focus tool for
roughness measurement.
Click here for details.

Quantum Efficiency (QE) Uniformity measurements,
using white light and color scanner technology.

Glass Bow, Roller Wave, full Glass substrate scalable
metrology (0.5 m x 1 m, 2 m x 2 m), and larger glass.
Interferometric Probe a Non Contact Wafer Thickness and
Wafer Topo- and Tomography

Low Coherence Metrology for:
ZebraOptical Optoprofiler