| OptoProfiler for uncoated and coated large Glass for Thin Film Solar Cell Manufacturing: Topography and Stress Measurements Glass Substrate Metrology: Bow, Warp, and Topography Coating Measurement Stress metrology TheOptoprofiler Glass Substrate Option has been demonstrated to be a powerful tool for measurement of large coated glass surfaces. Optoprofiler Glass Substrate Option offers following advantages 1. It measures entire glass surface in < 4 sec 2. Can measure 2 m x 2 m or larger glass plates 4. Small footprint (4' x 6' or smaller for 50 cm x 100 cm glass) for easy integration 5. Can operate in presence of moderate stray light 6. It is safe - Does not employ laser radiation Optoprofiler Glass Substrate Option system can be used in two configurations: 1. Reflective instant scanner configuration for bare glass 2. Standard structured light illumination for TiO coated glass substrates The Glass Substrate Option is to be customized for user specifications. Please contact us at sales@zebraoptical.com to arrange your sample measurements, discussion with our engineering team, which will allow us to provide the best value solution. Standard geometry strong signal in TiO coated glass Reflective geometry raw revealing roller wave Reflection in tempered glass window geometry raw revealing roller wave distortion |
| For more information about our products and services please contact us and request our brochures and technical product information. |
Sunrise Optical LLC
4851 NW 103rd Avenue
Sunrise FL 33351
sales@zebraoptical.com
Tel: 1 215 740 4831
Fax: 1 954 748 2302
4851 NW 103rd Avenue
Sunrise FL 33351
sales@zebraoptical.com
Tel: 1 215 740 4831
Fax: 1 954 748 2302
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ZebraOptical Optoprofiler Large Glass metrology