Sunrise Optical LLC
5352 NW 93rd Terr
Sunrise FL 33351
Tel: 1 954 648 6597
Fax: 1 954 748 2302
5352 NW 93rd Terr
Sunrise FL 33351
Tel: 1 954 648 6597
Fax: 1 954 748 2302
Sunrise Optical LLC: Press Release 5/16/11
Zebraoptical Integrated Metrology Tool - Low Coherence Fiber Optic
Interferometer with Microscope Attachment
Sunrise, Florida, May 16, 2011
Sunrise Optical LLC: New Zebraoptical Low Coherence Fiber Optic
Interferometer with Microscope Attachment has been developed for Micro
Electromechanical Systems (MEMS) applications, and is available for sale as
Zebraoptical Integrated Metrology Tool (ZIMT).
The Zebraoptical Integrated Metrology Tool employs standard Zebra Wafer
Thickness and Wafer Topography Metrology (ZebraOptical CT-IR) coupled
with optical microscope, and VIS/NIR spectrometer.
Zebraoptical Integrated Metrology Tool (ZIMT) allows user to measure
substrate thickness, membrane thickness, coating thickness, and investigate
optical properties of the coatings all on the same tool platform.
Please contact our sales department (sales@zebraoptical.com) for a more
detailed application notes, and schedule tool demonstration.
Product Availability:
Sample measurement service is available now (please contact
aplab@zebraoptical.com for details). Lead-time for the tool in the basic
configuration is currently 1 to 3 weeks ARO.
About Sunrise Optical LLC
Sunrise Optical LLC is an optical metrology company located in Sunrise FL. It
specializes in design and manufacturing of spectroscopic and imaging systems for
three-dimensional image acquisition and development of new algorithms for
three-dimensional image processing. Sunrise Optical LLC is serving the
solar cell manufacturing and thin film metrology markets. More information on
Sunrise Optical LLC can be found on the company website
www.zebraoptical.com.
Interferometer with Microscope Attachment
Sunrise, Florida, May 16, 2011
Sunrise Optical LLC: New Zebraoptical Low Coherence Fiber Optic
Interferometer with Microscope Attachment has been developed for Micro
Electromechanical Systems (MEMS) applications, and is available for sale as
Zebraoptical Integrated Metrology Tool (ZIMT).
The Zebraoptical Integrated Metrology Tool employs standard Zebra Wafer
Thickness and Wafer Topography Metrology (ZebraOptical CT-IR) coupled
with optical microscope, and VIS/NIR spectrometer.
Zebraoptical Integrated Metrology Tool (ZIMT) allows user to measure
substrate thickness, membrane thickness, coating thickness, and investigate
optical properties of the coatings all on the same tool platform.
Please contact our sales department (sales@zebraoptical.com) for a more
detailed application notes, and schedule tool demonstration.
Product Availability:
Sample measurement service is available now (please contact
aplab@zebraoptical.com for details). Lead-time for the tool in the basic
configuration is currently 1 to 3 weeks ARO.
About Sunrise Optical LLC
Sunrise Optical LLC is an optical metrology company located in Sunrise FL. It
specializes in design and manufacturing of spectroscopic and imaging systems for
three-dimensional image acquisition and development of new algorithms for
three-dimensional image processing. Sunrise Optical LLC is serving the
solar cell manufacturing and thin film metrology markets. More information on
Sunrise Optical LLC can be found on the company website
www.zebraoptical.com.
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