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6/09/13 Sunrise Optical LLC: Zebraoptoprofiler Model X - nano-radian probe
5/22/12 Sunrise Optical LLC: Zebraoptoprofiler Model X - the Long Optical
Arm Commercial Scanner for Large Radii X-ray Mirrors and Wafer Stress
3/29/12 SOI and small bow metrology
6/22/11 LED and Power Electronics Heat Sink Metrology
6/21/11 Volume of Drops and Splatters - Forensic Measurements Using
Portable Zebraoptical Optoprofiler - Volume Metrology Application
5/16/11 Zebraoptical Integrated Metrology Tool - Low Coherence Fiber Optic
Interferometer with Microscope Attachment
5/4/11 Liquid Drops and Splatters Forensic Measurements Using Portable
1/4/11 The Portable Zebraoptical OptoProfiler for topography of small and
medium size objects.
Review paper on metrology techniques for thin wafers, MEMs membranes,
and deep trenches available at email@example.com
Zebraoptical OptoProfiler for QE Uniformity metrology for crystalline and
thin film solar cells is available. Sunrise Optical LLC is accepting
pre-qualified samples for the tool evaluation.
New family of surface plate accessories for Zebraoptical OptoProfiler for
bow, warp for large crystalline solar cells, MEMs substrates and other
Zebraoptical OptoProfiler for bow, warp, roller wave glass, edge kink
metrology for tempered glass, and thin film solar cells
ZebraOptical CT-IR an Interferometric Probe for Substrate Thickness,
Topography, Trench Depth, Membrane Thickness and other Applications
from Sunrise Optical LLC
Sunrise Optical LLC, manufacturer of Zebra Optoprofiler, donated chess
boards to Lauderdale Lakes Middle School in Fort Lauderdale Florida.
New Zebra OptoProfiler Large Glass Option for Solar Glass Substrate Bow,
Warp, Roller Wave and Full Surface Topography
New Zebra OptoProfiler Tool for Patterned Solar Cell Bow, Warp, Full
Surface Topography and Full Stress Tensor Characterization from Sunrise
"Efficient calibration algorithm, and calibration pattern for correcting
distortions for three-dimensional image acquisition systems for
microscopic applications" Wojtek J. Walecki and Fanny Szondy
Proc. SPIE Vol. 6861, 68610S (Feb. 12, 2008)
"Fast in-line surface topography metrology enabling stress calculation
for solar cell manufacturing for throughput in excess of 2000 wafers
per hour" W J Walecki, F Szondy and M M Hilali 2008 Meas. Sci.
Technol. 19 025302 (6pp) doi:10.1088/0957-0233/19/2/025302