For detailed information about our products and services please contact us
and request our brochures and technical product information.
Conferences and Shows

10/26/10
Poster session titled New Optical Inspection Technology for Packaging
Applications at SMTA International October 24-28, 2010 Orlando FL.

Company News

6/22/11 LED and Power Electronics Heat Sink Metrology

6/21/11 Volume of Drops and Splatters - Forensic Measurements Using
Portable Zebraoptical Optoprofiler - Volume Metrology Application

5/16/11 Zebraoptical Integrated Metrology Tool - Low Coherence Fiber Optic
Interferometer with Microscope Attachment

5/4/11 Liquid Drops and Splatters Forensic Measurements Using Portable
Zebraoptical Optoprofiler

1/4/11 The Portable Zebraoptical OptoProfiler for topography of small and
medium size objects.

4/4/10
Review paper on metrology techniques for thin wafers, MEMs membranes,
and deep trenches available at sales@zebraoptical.com

3/12/10
Zebraoptical OptoProfiler for QE Uniformity metrology for crystalline and
thin film solar cells is available. Sunrise Optical LLC is accepting
pre-qualified samples for the tool evaluation.

1/21/10
New family of surface plate accessories for Zebraoptical OptoProfiler for
bow, warp for large crystalline solar cells, MEMs substrates and other
devices.

1/04/10
Zebraoptical OptoProfiler for bow, warp, roller wave glass, edge kink
metrology for tempered glass, and thin film solar cells

12/16/09
ZebraOptical CT-IR an Interferometric Probe for Substrate Thickness,
Topography, Trench Depth, Membrane Thickness and other Applications
from Sunrise Optical LLC

4/14/09
Sunrise Optical LLC, manufacturer of Zebra Optoprofiler, donated chess
boards to Lauderdale Lakes Middle School in Fort Lauderdale Florida.

7/31/08
New Zebra OptoProfiler Large Glass Option for Solar Glass Substrate Bow,
Warp, Roller Wave and Full Surface Topography

4/14/08
New Zebra OptoProfiler Tool for Patterned Solar Cell Bow, Warp, Full
Surface Topography and Full Stress Tensor Characterization from Sunrise
Optical LLC
Publications

"Efficient calibration algorithm, and calibration pattern for correcting
distortions for three-dimensional image acquisition systems for
microscopic applications" Wojtek J. Walecki and Fanny Szondy
Proc. SPIE Vol. 6861, 68610S (Feb. 12, 2008)

"Fast in-line surface topography metrology enabling stress calculation
for solar cell manufacturing for throughput in excess of 2000 wafers
per hour"   W J Walecki, F Szondy and M M Hilali 2008 Meas. Sci.
Technol. 19 025302 (6pp) doi:10.1088/0957-0233/19/2/025302
IP / Terms of use
Sunrise Optical LLC
4851 NW 103rd Ave
Sunrise FL 33351
sales@zebraoptical.com
Tel:  1 954 748 2302
Fax: 1 954 654 1734
ZebraOptical Optoprofiler:
Publications / Conferences / Shows