Dimensional and Stress Metrology for
Bow, and Warp,
measurements on
crystalline
,
thin film
materials,
and
minipanel
s
.
New metrology for
X-ray mirrors
(see
Model X
Video demo
).
Projection
Tool for
Topography
and
QE Uniformity
Spectral
Mapping
Characterisation
Glass
Bow,
Roller
Wave
,
large Glass
substrate scalable metrology (0.5 m x
1m , 2 m x 2 m, and larger glass).
Sunrise FL 33351
sales@zebra
optical
.com
Tel: 1 215 740 4831
Fax: 1 954 748 2302
IP / Terms of use
Interferometric Probe a Non Contact
Wafer
Thickness
and Wafer Topo
- and Tomography
Integrated X Y Z scanners
Low Coherence Metrology for
-wafer thickness measurement
-trench depth measurement
-membrane thickness measurement
-SOI thick and thin layer metrology
-laser and LED application
-MEMs tomography applications
For Measurement
video
s
on selected models please click
here
.
Please
contact
us for detailed application notes at
sales@zebraoptical.com .
ZebraOptical Optoprofiler / Cameras / Components