Dimensional and Stress Metrology for
Bow, and Warp,
measurements on crystalline,
thin film materials, and minipanels.
New metrology for X-ray mirrors
(see Model X Video demo).
Projection Tool for Topography and
QE Uniformity Spectral Mapping
Characterisation
Glass Bow, Roller Wave, large Glass
substrate scalable metrology (0.5 m x
1m , 2 m x 2 m, and larger glass).
Sunrise FL 33351
sales@zebraoptical.com
Tel: 1 215 740 4831
Fax: 1 954 748 2302
sales@zebraoptical.com
Tel: 1 215 740 4831
Fax: 1 954 748 2302
Interferometric Probe a Non Contact Wafer Thickness
and Wafer Topo- and Tomography
Integrated X Y Z scanners
Low Coherence Metrology for
-wafer thickness measurement
-trench depth measurement
-membrane thickness measurement
-SOI thick and thin layer metrology
-laser and LED application
-MEMs tomography applications
For Measurement videos on selected models please click here.
Please contact us for detailed application notes at
sales@zebraoptical.com .
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ZebraOptical Optoprofiler / Cameras / Components
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