Projection Tool for Topography and QE Uniformity
Spectral Mapping Characterisation
Dimensional Metrology for Bow, and Warp,
measurements on crystalline, thin film materials,
and minipanels.
Quantum Efficiency (QE) Uniformity measurements,
using white light and color scanner technology
Glass Bow, Roller Wave, full Glass substrate scalable
metrology (0.5 m x 1m , 2 m x 2 m, and larger glass).
Spectral Mapping Characterisation
Dimensional Metrology for Bow, and Warp,
measurements on crystalline, thin film materials,
and minipanels.
Quantum Efficiency (QE) Uniformity measurements,
using white light and color scanner technology
Glass Bow, Roller Wave, full Glass substrate scalable
metrology (0.5 m x 1m , 2 m x 2 m, and larger glass).
Sunrise FL 33351
sales@zebraoptical.com
Tel: 1 954 873 4660
Fax: 1 954 748 2302
sales@zebraoptical.com
Tel: 1 954 873 4660
Fax: 1 954 748 2302
Interferometric Probe a Non Contact Wafer
Thickness and Wafer Topo- and Tomography
Low Coherence Metrology for
-wafer thickness measurement
-trench depth measurement
-membrane thickness measurement
-laser and LED application
-MEMs tomography applications
For Measurement videos on selected models please click
here.
Please contact us for detailed application notes at
sales@zebraoptical.com .
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ZebraOptical Optoprofiler