Projection
Tool for
Topography and QE Uniformity
Spectral Mapping Characterisation
Dimensional Metrology for
Bow, and Warp,
measurements on
crystalline
, thin film
materials,
and
minipanel
s
.
Quantum Efficiency (QE) Uniformity measurements,
using white light and color scanner technology
Glass
Bow,
Roller
Wave
,
full Glass substrate scalable
metrology (0.5 m x 1m , 2 m x 2 m, and larger glass).
Sunrise FL 33351
sales@zebra
optical
.com
Tel: 1 954 873 4660
Fax: 1 954 748 2302
IP / Terms of use
Interferometric Probe a Non Contact
Wafer
Thickness and Wafer Topo
- and Tomography
Low Coherence Metrology for
-wafer thickness measurement
-trench depth measurement
-membrane thickness measurement
-laser and LED application
-MEMs tomography applications
For Measurement
video
s
on selected models please click
here
.
Please
contact
us for detailed application notes at
sales@zebraoptical.com .
ZebraOptical Optoprofiler