Expertise of members of our staff in various
Selected papers in Interferometry:
Walecki et al, "Characterization of the polarization state of weak
ultrashort coherent signals by dual-channel spectral interferometry"
Optics Letters, Vol. 22, Issue 2, pp. 81-83
Walecki et al, "Measurement of the ultrafast polarization dynamics
of weak four-wave mixing signals by dual-channel femtosecond
spectral interferometry" JOSA B, Vol. 15, Issue 3, pp. 1218-1223
Walecki et al "Non-contact fast wafer metrology for ultra-thin
patterned wafers mounted on grinding and dicing tapes"
Electronics Manufacturing Technology Symposium, 2004.
IEEE/CPMT/SEMI 29th International Volume , Issue , July 14-16,
2004 Page(s): 323 - 325
Walecki et al "Temporally and spectrally resolved amplitude and
phase of coherent four-wave-mixing emission from GaAs quantum
wells" Phys. Rev. B 56, 9738 - 9743 (1997)
Walecki, et al, "Interferometric Metrology for Thin and Ultra-Thin
Compound Semiconductor Structures Mounted on …" GaAs
Walecki et al "Low-coherence interferometric absolute distance
gauge for study of MEMS structures" Proc. SPIE, Vol. 5716, 182
Walecki et al "Novel noncontact thickness metrology for backend
manufacturing of wide bandgap light emitting devices " physica
status solidi (c), Volume 2 Issue 3, Pages 984 - 989 Published
Online: 16 Feb 2005
Walecki et al, " Advanced Fringe Analysis Techniques in Circuit
Edit", ISTFA 2006
Walecki et al, High-speed high-accuracy fiber optic low-coherence
interferometry for in situ grinding and etching process monitoring
[6293-13] PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY
FOR OPTICAL ENGINEERING Bibliographic details 2006, VOL
6293, pages 62930D
Walecki et al , "Synchronized low coherence interferometry for in-
situ and ex-situ metrology for semiconductor manufacturing" Proc.
SPIE, Vol. 5880, 58800H (2005); DOI:10.1117/12.615254
Sample Measurement and Analysis Services
We provide sample stress measurement and analysis services. As
a result of measurement you will receive sample measurement
report, supported by full information on traceability of our laboratory
In addition to standard report our engineering staff will be happy to
discuss any additional measurements such as QE mapping,
roughness, diffuse reflection whichever you may have.
Please do not hesitate to contact us and discuss more details.
ZebraOptical Optoprofiler: Services